X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.8 295.0 PEG 8000, AMMONIUM SULFATE, pH 5.8, VAPOR DIFFUSION, HANGING DROP, temperature 22K
Unit Cell:
a: 82.344 Å b: 82.344 Å c: 82.344 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 3
Crystal Properties:
Matthew's Coefficient: 1.76 Solvent Content: 30.13
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? ? 1.76 19.4 18449 1093 98.7 0.1890000 0.2170000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 19.4 98.7 0.0540000 ? 21 5.2 95188 18449 3.0 3.0 22
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.76 1.82 98.7 ? ? ? 3.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 ? SSRL BL7-1
Software
Software Name Purpose Version
AMoRE phasing .
REFMAC refinement .
DENZO data reduction .
CCP4 data scaling (TRUNCATE)