X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.40 ? 100MM SODIUM CACODYLATE (PH 6.4), 14.5% PEG 2000 MONOMETHYLETHER, 20% GLYCEROL, 3% PEG 200, 1 MM PHENYLFERRICROCIN-IRON
Unit Cell:
a: 172.100 Å b: 172.100 Å c: 87.650 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61
Crystal Properties:
Matthew's Coefficient: 4.6 Solvent Content: 74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.95 50 30289 1494 96.6 0.225 0.278 70.8
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.950 30.000 94.8 0.06400 0.06200 20.2600 3.000 ? 32078 ? 0.000 -0.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.95 2.99 77.7 0.25100 4.030 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I711 ? MAX II I711
Software
Software Name Purpose Version
CNS refinement 0.4
XDS data reduction .
XSCALE data scaling .
CNS phasing 0.4
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