X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.3 298 36% PEG 550 MME, 50 mM NaCl, 100 mM Tris pH 7.3, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 102.048 Å b: 66.137 Å c: 78.185 Å α: 90.00° β: 105.78° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.87 Solvent Content: 33.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.35 33.52 99104 5202 95.39 0.13389 0.17347 8.130
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.35 50.00 95.5 ? 0.054 22.10 3.14 104310 104310 0 0 13.578
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.35 1.40 68.4 ? 0.402 1.86 1.40 7413
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97945 APS 19-ID
Software
Software Name Purpose Version
REFMAC refinement 5.1.24
TRUNCATE data reduction .
XTALVIEW refinement .
HKL-2000 data collection .
HKL-2000 data reduction .
CCP4 data scaling (TRUNCATE)
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