X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 293 Na-sulphate, Na-Citrate, pH 5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 32.869 Å b: 37.022 Å c: 39.780 Å α: 102.89° β: 104.59° γ: 102.37°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.97 Solvent Content: 37.56
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 0.80 30.00 165919 ? 92.7 ? ? ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.80 30 92.7 ? 0.033 15 4 165919 165919 -3.0 -3.0 4.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.80 0.81 73 ? 0.162 6.2 4 3430
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X11 0.8110 EMBL/DESY, HAMBURG X11
Software
Software Name Purpose Version
SHELXL refinement .
DENZO data reduction .
SCALEPACK data scaling .
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