X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.70 ? PROTEIN CRYSTALLISED FROM 0.1M MES PH 6.7 6-10% PEG 20000, SOAKED IN 10MM NAD, pH 6.70
Unit Cell:
a: 122.100 Å b: 122.100 Å c: 184.000 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 3.42 Solvent Content: 64.01
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ISOMORPHOUS TO NATIVE FREE R 2.00 30.0 31042 ? 85.0 ? 0.2600000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 18.000 92.0 0.0440000 ? 13.1000 3.100 ? 188299 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.05 94.1 ? ? 1.600 3.20 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX9.5 ? SRS PX9.5
Software
Software Name Purpose Version
CCP4 model building .
TNT refinement 5E
MOSFLM data reduction .
CCP4 data scaling (AGROVATA
ROTAVATA data scaling .
CCP4 phasing .
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