X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7. ? pH 7.
Unit Cell:
a: 84.000 Å b: 205.400 Å c: 192.200 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 3.84 Solvent Content: 62.
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION COMBINED MOLECULAR REPLACEMENT AND ISOMORPHOUS REPLACEMENT FREE R 3.2 90.6 27079 1451 ? 0.226 0.286 0.94
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.2 96.2 98.6 0.086 ? 3.8 5.1 ? 27079 ? 1.0 0.29
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.21 3.34 98.6 ? ? 5.1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX9.6 0.87, 1.0 SRS PX9.6
Software
Software Name Purpose Version
DENZO data reduction .
CCP4 data reduction .
DM model building .
RAVE model building .
X-PLOR model building .
X-PLOR refinement .
CCP4 data scaling .
DM phasing .
RAVE phasing .
X-PLOR phasing .
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