X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.4 294 MPD, sodium acetate, calcium chloride, pH 5.4, VAPOR DIFFUSION, SITTING DROP, temperature 294K
Unit Cell:
a: 76.460 Å b: 87.930 Å c: 124.390 Å α: 90.00° β: 106.78° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.67 Solvent Content: 53.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT TEST SET OF REFLECTIONS NOT USED IN REFINEMENT BUT TO MONITOR R-FREE 2.8 30.0 36893 1900 94.3 0.26 0.28 75.8
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 30.0 98.0 0.05 0.05 24.4100 3.5 38321 38321 0.0 0.0 80.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.80 2.82 99.7 ? 0.61 1.920 3.5 982
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX7.2 1.488 SRS PX7.2
Software
Software Name Purpose Version
XDS data scaling .
TRUNCATE data reduction .
DM model building .
CNS refinement 1.0
XDS data reduction .
CCP4 data scaling (TRUNCATE)
DM phasing .