X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 298 Peg 400, TRIS-HCl, pH 7.50, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 36.92 Å b: 80.05 Å c: 96.62 Å α: 90° β: 90° γ: 90°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.03 Solvent Content: 39.74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION UNCONVENTIANAL METHOD USING THE GROUP-SUBGROUP RELATION THROUGHOUT 2.90 15.0 6492 309 96.3 0.26943 0.31979 61.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.90 33.3 96.8 0.109 0.109 11.2 5.7 ? 6492 ? ? 68.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 3.06 89.0 ? 0.573 3.1 5.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R 1.2000 ELETTRA 5.2R
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
REFMAC refinement 5.1
CCP4 data scaling (SCALA)