X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 298 peg 400, Buffer Tris-HCl, pH 7.50, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 88.888 Å b: 149.177 Å c: 38.578 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.57 Solvent Content: 54.83
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION UNCONVENTIONAL METHOD USING THE GROUP-SUBGROUP RELATION THROUGHOUT 2.99 15.0 5371 240 98.1 0.22931 0.30542 32.402
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.99 76.4 98.1 0.051 0.051 16.5 2.2 ? 5371 ? ? 56.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.91 2.01 98.1 ? 0.168 7.0 2.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R 1.2000 ELETTRA 5.2R
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
REFMAC refinement .
CCP4 data scaling (SCALA)