ISDA: 1OVN

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.1	293	mixing 6ul [5.8mg/ml Wind in 5mM HEPES pH7.5, 25mM NaCl, 0.0025%(V/V) beta-mercaptoethanol] with 3ul [0.1M MES pH6.1, 0.1M CsCl, 2mM CaCl2, 16%(V/V) PEG 300] cryo-condition: 0.1M Mes pH6.1, 20%(V/V) PEG 300, 10%(V/V)glycerol, 0.1M CsCl, 2mM CaCl2, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Unit Cell:

a: 106.678 Å b: 50.358 Å c: 98.616 Å α: 90.00° β: 112.84° γ: 90.00°

Symmetry:

Space Group: C 1 2 1

Crystal Properties:

Matthew's Coefficient: 2.1 Solvent Content: 42.1

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SIRAS	THROUGHOUT	1.90	35.17	38216	1859	99.8	0.2179	0.25571	37.247

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.90	37.64	99.8	?	0.0565	13.96	4.50	38218	38218	?	-3	49.18

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.90	2.00	99.6	?	0.2759	4.77	3.79	5373

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	EMBL/DESY, HAMBURG BEAMLINE X11	0.811	EMBL/DESY, HAMBURG	X11

Software