X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 293 10% isopropanol, 200mM Lithium sulfate, citrate-phosphate buffer, pH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 166.241 Å b: 166.241 Å c: 166.241 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 41 3 2
Crystal Properties:
Matthew's Coefficient: 4.81 Solvent Content: 74.22
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.45 27.70 14339 721 97.39 0.21694 0.26341 51.773
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 27.70 97.5 0.055 0.046 15.66 4.2 14386 14386 0 0 39
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.45 2.55 99.9 ? 0.45 1.99 4.6 1610
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-BM ? APS 17-BM
Software
Software Name Purpose Version
REFMAC refinement 5.1.19
HKL-2000 data reduction .
SCALEPACK data scaling .
AMoRE phasing .