ISDA: 1OK9

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.60	?	0.2 M AMMONIUM SULPHATE, 20% M-PEG 5K, 0.1M SODIUM ACETATE PH 4.6, 16% GLYCEROL THEN SOAKED IN 2 MM K2PTCL4 FOR 6 DAYS

Unit Cell:

a: 46.130 Å b: 54.600 Å c: 62.770 Å α: 87.19° β: 85.61° γ: 65.74°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.55 Solvent Content: 50

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	3.0	20	10338	?	93	?	?	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.000	41.900	93.0	0.05300	?	9.1000	3.800	?	10372	?	?	2.1

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.00	3.16	92.7		?	5.800	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100.0 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SRS BEAMLINE PX14.2	?	SRS	PX14.2

Software