1OK2

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.60 ? 0.2 M AMMONIUM SULPHATE 20% M-PEG 5K, 0.1M SODIUM ACETATE PH 4.6, 10% GLYCEROL
Unit Cell:
a: 47.580 Å b: 55.620 Å c: 61.530 Å α: 86.56° β: 84.44° γ: 64.22°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.59 Solvent Content: 50
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5 19 18283 ? 99 ? ? ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 19.000 99.0 0.07000 ? 15.4000 7.000 ? 18310 ? ? 0.239
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 . ? 98.0 ? 11.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R ? ELETTRA 5.2R
Software
Software Name Purpose Version
SHARP model building .
TNT refinement 5F
SCALA data scaling .
MOLREP phasing .
BUSTER phasing .
TNT phasing .
SHARP phasing .
DM phasing .
SOLOMON phasing .
SIGMAA phasing .