X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 ? 16% PEG 10000, 10MM ATP, 10 MM LIS, 100MM HEPES PH=7.5, pH 7.50
Unit Cell:
a: 115.200 Å b: 115.200 Å c: 160.890 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 2 2
Crystal Properties:
Matthew's Coefficient: 3.2 Solvent Content: 61
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.49 8.00 12795 916 97.3 0.224 0.273 27.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.480 57.200 100.0 0.13900 ? 4.5000 4.800 ? 13561 ? 4.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.48 3.69 98.7 ? 2.000 4.80 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 120.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ENRAF-NONIUS ? ? ?
Software
Software Name Purpose Version
X-PLOR refinement 3.843
MOSFLM data reduction .
SCALA data scaling .
X-PLOR phasing .