X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.50 293 25.5 % PEG 4000; 0.085 M Tris pH 8.5; 0.17 M Na(Ac), 15 % Glycerol, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 293K, pH 8.50
Unit Cell:
a: 58.410 Å b: 58.410 Å c: 102.490 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 2.32 Solvent Content: 46.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.00 29.49 11574 887 99.0 0.186 0.238 23.83
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 32.159 99.0 ? 0.061 28.1000 11.800 ? 12462 ? ? 36.49
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.05 90.9 ? 0.375 3.200 6.20 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 0.97780, 0.91840, 0.97920 ALS 5.0.2
Software
Software Name Purpose Version
REFMAC refinement .
SCALA data scaling .
RESOLVE model building .
SOLVE phasing .
CNS refinement .
XFIT data reduction .
MOSFLM data reduction .
CCP4 data scaling (SCALA)
RESOLVE phasing .