X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 277 HANGING DROP METHOD AT 4 C BY MIXING 5 MICRLITER PROTEIN AT 10- 15MG PER ML WITH 5 MICROLITER 30-36% PEG8000 SOLUTION CONTAINING 5MM TRIS-HCL BUFFER, PH 6.5-7.5 AND 100MM NACL., vapor diffusion - hanging drop, temperature 277K
Unit Cell:
a: 43.250 Å b: 50.650 Å c: 54.600 Å α: 90.00° β: 107.79° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.03 Solvent Content: 39.4
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.92 8.0 15329 ? 92.9 0.169 0.257 25.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.92 20.0 92.5 0.048 ? 11.7 3.5 ? 16127 ? 0.0 20.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.92 2.06 60. ? 2.5 1.6
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R ? ? ?
Software
Software Name Purpose Version
SOFTWARE data collection FROM HAMLIN MULTIWIRE AREA DETECTOR
SAME data reduction AS ABOVE
X-PLOR model building 3.1
X-PLOR refinement 3.1
HAMLIN data reduction .
HAMLIN data scaling .
X-PLOR phasing 3.1