X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 287 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
ROTATING ANODE | RIGAKU RUH2R | ? | ? | ? |
Software Name | Purpose | Version |
---|---|---|
PROCESS | data collection | . |
PROCESS | data reduction | . |
SHAKE-N-BAKE | model building | . |
X-PLOR | refinement | 3.1 |
PROCESS | data scaling | . |
SHAKE-N-BAKE | phasing | . |