X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 30% PEG 4000, 0.2 M AMMONIUM ACETATE, 0.1 M SODIUM CITRATE, pH 6.5, VAPOR DIFFUSION, temperature 291K
Unit Cell:
a: 39.368 Å b: 49.580 Å c: 91.009 Å α: 90.00° β: 101.66° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.74 Solvent Content: 29.3
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR FREE R THROUGHOUT 1.42 50.00 58915 5972 90.6 0.108 0.161 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.42 44.57 90.6 0.066 ? 10.17 3.51 58915 58915 0.0 0.0 12.67
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.42 1.52 55.8 ? ? 4.02 1.91 8061
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 290 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.5418 ? ?
Software
Software Name Purpose Version
SOLVE phasing .
PHASES phasing .
X-PLOR model building 3.851
SHELXL-97 refinement .
SDMS data reduction DETECTOR SYSTEM
SDMS data scaling .
X-PLOR phasing V. 3.851
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