X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293 PEG 6000, Citric acid, Xylitol, pH 5.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 107.694 Å b: 38.149 Å c: 64.736 Å α: 90.00° β: 112.21° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.89 Solvent Content: 34.91
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.9 50.0 18720 1288 96.0 ? 0.23 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 97.8 0.117 ? 18.3 7.0 18988 18988 0.0 0.0 46.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 1.97 84 ? ? ? ? 1620
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 0.979 NSLS X25
Software
Software Name Purpose Version
MARMAD data collection .
HKL-2000 data reduction .
SOLVE phasing .
SHARP phasing .
DM model building .
CNS refinement .
MARMAD data reduction .
HKL-2000 data scaling .
DM phasing .