X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 163 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | SIEMENS | 0.7107 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| SAINT | data reduction | . |
| CNS | refinement | . |
| SAINT | data scaling | . |
| CNS | phasing | . |
