X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 294 sodium acetate, PEG4000, ammonium acetate, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 294K
Unit Cell:
a: 100.727 Å b: 48.678 Å c: 74.690 Å α: 90.00° β: 120.82° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.07 Solvent Content: 40.23
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.94 30.00 21926 1182 99.700 0.18641 0.2268 21.106
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.94 30.00 99.4 0.073 ? 21.29 11.0 ? 23111 ? -3.00 28.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.94 2.01 94.8 ? ? 5.8 ? 2170
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X9B 0.97946, 0.97133, 0.97900 NSLS X9B
Software
Software Name Purpose Version
HKL-2000 data collection .
TRUNCATE data reduction .
SHARP phasing .
REFMAC refinement 5.1.24
HKL-2000 data reduction .
CCP4 data scaling (TRUNCATE)