X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.7 294.0 CO-saturated, 2.8M ammonium sulphate, 100mM Tris-Cl, 1 mM dithionite, crystallized in seeded batch, pH 8.7, temperature 294.0K
Unit Cell:
a: 91.200 Å b: 91.200 Å c: 45.712 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 6
Crystal Properties:
Matthew's Coefficient: 3.14 Solvent Content: 60.85
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION Rigid Body from starting model THROUGHOUT 1.60 29.88 28574 1422 99.2 0.167 0.184 19.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 29.88 96.0 ? 0.064 37.1 26.7 31195 31195 0.0 -3.0 19.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.55 1.62 75.9 ? 0.414 4.5 4.1 3574
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 283 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID09 ? ESRF ID09
Software
Software Name Purpose Version
SPEC data collection .
PROW data reduction + CCP4
CNS refinement 1.0
SPEC data reduction .
PROW data scaling .
CCP4 data scaling .
CNS phasing 1.0