X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 298.0 8 % PEG monomethyl ether 5000, 20% Glycerol, 200 mM Calcium Acetate, 100 mM PIPES pH 6.5, 2 mM dithioerythritol, VAPOR DIFFUSION, SITTING DROP, temperature 298.0K
Unit Cell:
a: 99.749 Å b: 136.973 Å c: 141.532 Å α: 101.45° β: 109.05° γ: 103.94°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.73 Solvent Content: 54.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD and Molecular Replacement THROUGHOUT 2.2 20.0 301055 14965 90.6 ? 0.241 41
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50.0 95.1 ? 0.093 12.0 3.3 332287 313013 0.0 -1.0 30.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.28 91.3 ? 0.39 ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.2000 ALS 5.0.2
Software
Software Name Purpose Version
HKL-2000 data collection .
SCALEPACK data scaling .
SHELXD phasing .
DM model building .
DMMulti model building .
EPMR phasing .
CNS refinement 1.0
DENZO data reduction .
DM phasing .
DMMulti phasing .