X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? METHANOL:ACETONITRILE 1:10, EVAPORATION, RECRYSTALLIZATION, TEMPERATURE 268K
Unit Cell:
a: 9.490 Å b: 16.850 Å c: 31.680 Å α: 95.77° β: 98.07° γ: 99.45°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.30 Solvent Content: 8.28
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 0.90 10.00 ? 688 99.7 0.075 0.092 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.900 10.000 99.7 0.05140 ? 15.0300 2.790 ? 13427 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.90 0.95 99.9 ? ? 2.360 2.18 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 150 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS ? SRS ?
Software
Software Name Purpose Version
MOLREP phasing .
ARP/wARP model building .
SHELXL-97 refinement .
SMART data reduction V. 5.054 (BRUKER)
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