X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 293 5% wt/v PEG 6000, 100 mM TrisCl, pH 8.0, and 1 mM ZnSO4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 78.477 Å b: 78.477 Å c: 97.674 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 63 2 2
Crystal Properties:
Matthew's Coefficient: 2.97 Solvent Content: 58.57
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.914 19.84 13441 664 95.32 0.1832500 0.2227500 23.390
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.914 19.84 98.8 0.0830000 0.0830000 16.1 ? 13441 13441 ? 0 19.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.914 2.01 94.3 ? 0.3220000 2.7 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 0.9791, 0.9611 ALS 5.0.2
Software
Software Name Purpose Version
MLPHARE phasing .
REFMAC refinement 5.0
HKL-2000 data reduction .
SCALEPACK data scaling .