X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 295 0.1M Tris, 15% PEG8000, 50mM Ammonium Sulfate, 0.2M Magnesium Chloride, 10mM NADPH, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K
Unit Cell:
a: 58.300 Å b: 81.460 Å c: 145.020 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 44.90
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.604 10.00 81579 2508 100.00 0.14634 0.18589 17.775
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 20 92.6 0.065 ? 23.8 6.3 84533 84533 ? -3 14.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.64 57.8 ? ? 4.1 3.5 3455
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.0072 APS 17-ID
Software
Software Name Purpose Version
HKL-2000 data collection .
SCALEPACK data scaling .
MLPHARE phasing .
REFMAC refinement 5.0
HKL-2000 data reduction .