X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? THIS STRUCTURE WAS BUILT USING DATA COLLECTED ON ONE CRYSTAL. THE CRYSTAL SUFFERED FROM MEROHEDRAL TWINNING, WHERE TWO TWIN COMPONENTS CONTRIBUTE TO DIFFERENT DEGREES TO THE DIFFRACTION INTENSITIES. THE DATA SET WAS MODIFIED TO REMOVE THE CONTRIBUTION FROM THE MINOR TWIN COMPONENT, BEFORE THE REFINEMENT. THE MODIFICATION IS CARRIED OUT BY REMOVAL OF SOME REFLECTIONS AND BY INTENSITY CORRECTIONS OF OTHERS. THE DEPOSITED STRUCTURE FACTORS HAVE BEEN MODIFIED.
Unit Cell:
a: 229.500 Å b: 95.600 Å c: 86.800 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.40 Solvent Content: 48.74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? ? 2.6 7.5 15621 ? 82.5 0.193 0.255 17.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 50.0 83. 0.05 ? ? 2.1 ? 26271 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 ? K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
? ? 1.5418 ? ?
Software
Software Name Purpose Version
MADNES data collection .
X-PLOR model building 3.1
X-PLOR refinement 3.1
MADNES data reduction .
X-PLOR phasing 3.1