X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.4 298 10% PEG 8000, 0.2 M magnesium acetate, 0.1 M cacodylate, pH 6.4, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 111.26 Å b: 111.26 Å c: 65.64 Å α: 90° β: 90° γ: 120°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 4.78 Solvent Content: 74.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD and Molecular Replacement THROUGHOUT 3.32 15.00 6898 754 ? 0.297 0.329 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.32 30.00 99.70 0.073 ? 17.30 ? 7127 6979 0.00 -3.00 68.14
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.32 3.42 100 ? ? 3.70 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.0715,1.0718,1.0534 APS 19-ID
Software
Software Name Purpose Version
HKL-2000 data collection .
HKL-2000 data reduction .
MLPHARE phasing .
AMoRE phasing .
X-PLOR refinement 3.851
HKL-2000 data scaling .
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