X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.4 298 20% PEG4K, 0.2M MgCl2, 0.1M Tris_HCl, pH 8.4, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 62.566 Å b: 53.558 Å c: 81.365 Å α: 90.00° β: 109.97° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.38 Solvent Content: 48.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.40 38.65 88731 4458 88.9 0.1860000 0.2050000 10.3
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.4 50 99.5 0.0780000 ? 20 6.0 99282 98786 2.0 2.0 9.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.40 1.45 98.2 ? ? 2.44 4.46 9695
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.9795, 0.9798, 0.9650 APS 19-BM
Software
Software Name Purpose Version
CNS refinement .
d*TREK data reduction .
HKL-2000 data scaling .
CNS phasing .
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