X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.20 293 35% MPD, 0.1M Na/k phosphate, pH 6.2, VAPOR DIFFUSION, SITTING DROP, temperature 293K, pH 6.20
Unit Cell:
a: 105.730 Å b: 105.730 Å c: 135.790 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4 2 2
Crystal Properties:
Matthew's Coefficient: 2.30 Solvent Content: 46.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 1.50 20.00 61064 3082 ? 0.173 0.189 16.10
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 20.000 99.4 ? 0.044 9.1000 4.500 ? 61417 ? 0.000 15.00
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.54 100.0 ? 0.234 2.800 4.50 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 ? SSRL BL9-2
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
RESOLVE model building .
SOLVE phasing .
CNS refinement .
CCP4 data scaling (SCALA)
RESOLVE phasing .