X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 297 peg8000, tris, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 297K
Unit Cell:
a: 50.871 Å b: 86.416 Å c: 58.213 Å α: 90.00° β: 109.75° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.66 Solvent Content: 53.77
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR+MAD THROUGHOUT 1.95 47.0 33613 2013 ? ? 0.2450000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 47.0 98.9 ? 0.0400000 11.4 3.5 34610 34217 1.0 1.0 29.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.95 2.0 89.4 ? 0.2190000 3.3 2.7 2281
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9795, 0.9797, 0.9184 ESRF ID14-4
Software
Software Name Purpose Version
SOLVE phasing .
CNS refinement 1.0
MOSFLM data reduction .
CCP4 data scaling (SCALA)
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