X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 95 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU | 1.54 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| SOLVE | phasing | . |
| RESOLVE | model building | . |
| X-PLOR | refinement | . |
| DENZO | data reduction | . |
| SCALEPACK | data scaling | . |
| RESOLVE | phasing | . |
