X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.1 295 PEG 4000, lithium sulfate, manganese sulfate, phosphoenolpyruvate, phenylalanine, bis-tris-propane, pH 8.1, VAPOR DIFFUSION, HANGING DROP at 295K
Unit Cell:
a: 290.097 Å b: 90.097 Å c: 155.798 Å α: 90.00° β: 120.77° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.84 Solvent Content: 56.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.8 20.0 84545 2598 100 0.2190000 0.2460000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.80 20.0 99.3 0.0760000 ? 24.0 6.8 84564 84546 0 0 38.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.80 2.90 98.7 ? ? 5.3 6.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 200 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97165 NSLS X4A
Software
Software Name Purpose Version
MLPHARE phasing .
DM model building .
CNS refinement .
REFMAC refinement .
DENZO data reduction .
SCALEPACK data scaling .
CCP4 data scaling (TRUNCATE)
DM phasing .
CNS phasing .