X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.00 293 ethanol, pH 7.00, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 40.840 Å b: 18.470 Å c: 22.340 Å α: 90.00° β: 90.80° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.40 Solvent Content: 30.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING DIFFERENCE DENSITY PEAKS 0.89 17.67 24174 ? 96.6 0.145 ? 3.58
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.89 17.67 96 ? ? 5.8 1 26368 26368 0.0 0.0 3.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.89 0.90 85 ? ? 3.98 1.0 704
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 160.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 ? ? ?
Software
Software Name Purpose Version
LEHMANN-LARSEN data collection .
TEXSAN data reduction .
MADSYS phasing .
PROLSQ refinement .
LEHMANN-LARSEN data reduction .
TEXSAN data scaling .