X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298.0 10% PEG 8000, 0.1 M Tris buffer, 0.4 M calcium chloride, 5% 2-methyl-2,4-pentanediol, pH 7.5, capillary crystallization, temperature 298.0K
Unit Cell:
a: 92.6 Å b: 200.1 Å c: 116.8 Å α: 90.0° β: 111.5° γ: 90.0°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.51 Solvent Content: 50.92
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.8 100.0 74708 3716 76.9 0.2590000 0.2870000 47.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 100.0 94.0 ? 0.0860000 8.6 2.5 ? 90759 -1 -1 63.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.80 2.90 80.8 ? 0.3560000 1.6 2.1 7792
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 1.3 NSLS X25
Software
Software Name Purpose Version
SOLVE phasing .
SHARP phasing .
DM model building .
CNS refinement 1.0
DENZO data reduction .
SCALEPACK data scaling .
DM phasing .
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