X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 295 Method: vapor diffusion-Hanging drop. Well Solution: PEG 4000 25%, MAGNESIUM CHLORIDE 0.2M, TRIS BUFFER 0.1M pH8.5. Drop composition: 15ul OF WELL SOLUTION, 15 ul OF PROTEIN (15mg/ml). Soaking medium: PEG 4000 (27.5%), magnesium chloride 0.2M, Tris buffer 0.1M pH 8.5, Mercury Acetate 0.5mM. Soaking time: 3.5 hrs. Cryo Protectant: Lithium Formate 15%. , VAPOR DIFFUSION, HANGING DROP, temperature 295K
Unit Cell:
a: 115.530 Å b: 115.530 Å c: 51.230 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 42
Crystal Properties:
Matthew's Coefficient: 2.25 Solvent Content: 45.3
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD(HG) free R throughout. 2.4 10.0 26405 1335 100 0.2099000 0.2992000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.30 40 100 ? 0.0891000 15.09 3.67 30314 30314 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.44 100 ? 0.4990000 1.68 3.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.00 APS 17-ID
Software
Software Name Purpose Version
SHELXS phasing .
MLPHARE phasing .
DM model building .
SHELXL-97 refinement .
X-GEN data reduction .
X-GEN data scaling .
DM phasing .