X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298 28-30% PEG4000, 100mM Tris pH 8.0, 10mM CaCl2, + 1.5% heptane-1,2,3-triol added to drop, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 30.566 Å b: 51.941 Å c: 59.100 Å α: 90.00° β: 102.19° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.77 Solvent Content: 41.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD (PT & BR) FREE R 1.37 25.9 38052 3072 99.9 ? 0.2214 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.37 25.9 99.9 0.0308 ? 26.79 6.47 38052 38052 ? -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.37 1.40 100.0 ? ? 3.06 3.63 2391
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-BM 0.91840 APS 17-BM
Software
Software Name Purpose Version
SHELXL-97 refinement .
SCALEPACK data scaling 1.96.1
XPREP data reduction 6.09
SOLVE phasing .
RESOLVE model building .
CNS refinement .
SHELX model building .
DENZO data reduction 1.96.1
RESOLVE phasing .
CNS phasing .
SHELX phasing .
Feedback Form
Name
Email
Institute
Feedback