X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 293 1.4M sodium potassium phosphate ph 7.5, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 293K, pH 7.50
Unit Cell:
a: 244.11 Å b: 244.11 Å c: 244.11 Å α: 90° β: 90° γ: 90°
Symmetry:
Space Group: I 41 3 2
Crystal Properties:
Matthew's Coefficient: 5.58 Solvent Content: 78.82
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R 2.30 39.60 52273 2639 95.3 0.234 0.279 49.26
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 182.000 95.3 ? 0.099 9.5500 4.300 ? 52273 ? ? 55.20
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.28 2.37 97.8 ? 0.77 0.960 4.60 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.3 ? ALS 5.0.3
Software
Software Name Purpose Version
Blu-Ice data collection .
MOSFLM data reduction .
CCP4 data reduction .
SCALEPACK data scaling .
SnB phasing .
MLPHARE phasing .
CCP4 model building .
SOLVE phasing .
CNS refinement 1.0
CCP4 data scaling (SCALA)
CCP4 phasing .