X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 293 0.8 M NaH2PO4/0.8 M KH2PO4, 0.1 M HEPES pH 7.5, VAPOR DIFFUSION, SITTING DROP, NANODROP, temperature 293K, pH 7.50
Unit Cell:
a: 90.9566 Å b: 90.9566 Å c: 90.9566 Å α: 90° β: 90° γ: 90°
Symmetry:
Space Group: P 2 3
Crystal Properties:
Matthew's Coefficient: 3.2 Solvent Content: 61.25
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.30 40.00 11136 574 99.9 0.19 0.234 28.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 40.677 99.9 ? 0.095 18.6 9.100 ? 11360 ? ? 39.10
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.42 99.9 ? 0.324 3.70000 3.90 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.91162, 0.979105, 0.979445 SSRL BL9-2
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
CCP4 data reduction .
SOLVE phasing .
RESOLVE model building .
CNS refinement 1.0
CCP4 data scaling (SCALA)
RESOLVE phasing .
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