X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.80 293 50% (v/v) PEG-200, 0.1M Tris pH 7.0, pH 6.8, VAPOR DIFFUSION, SITTING DROP, NANODROP, temperature 293K, pH 6.80
Unit Cell:
a: 77.413 Å b: 79.962 Å c: 89.430 Å α: 115.73° β: 97.57° γ: 110.44°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.81 Solvent Content: 55.94
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.85 24.99 36521 1938 96.6 ? 0.274 31.307
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.85 76.7 96.4 ? 0.075 5.2 4.1 ? 38502 ? 0.00 19.36
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.85 2.95 96.1 ? 0.232 2.2 3.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.9184, 0.9794, 0.9792 SSRL BL9-2
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
CCP4 data reduction .
CCP4 model building .
SOLVE phasing .
RESOLVE model building .
REFMAC refinement 5.0
CCP4 data scaling (SCALA)
CCP4 phasing .
RESOLVE phasing .