X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 290 MEPEG 2000, magnesium chloride, ethyl mercury thiosalicylate, HEPES, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 290K
Unit Cell:
a: 88.650 Å b: 88.650 Å c: 199.400 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32
Crystal Properties:
Matthew's Coefficient: 2.38 Solvent Content: 48.21
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.1 15.0 88762 4666 ? 0.1870000 0.2350000 31
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 33.3 94.1 0.0510000 ? ? 2.0 188246 96329 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.1 2.15 91.3 ? ? ? 1.9 6893
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX9.5 0.92 SRS PX9.5
Software
Software Name Purpose Version
CCP4 model building .
TFFC model building .
DM model building .
REFMAC refinement .
MOSFLM data reduction .
CCP4 data scaling (AGROVATA
ROTAVATA data scaling .
CCP4 phasing .
TFFC phasing .
DM phasing .