X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 291 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU RU200 | ? | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| HOWARD | data collection | . |
| NIELSEN | data collection | . |
| HOWARD | data reduction | . |
| NIELSEN | data reduction | . |
| X-PLOR | model building | 3.1 |
| X-PLOR | refinement | 3.1 |
| XENGEN | data reduction | (HOWARD |
| XUONG) | data reduction | . |
| XENGEN | data scaling | (HOWARD |
| NIELSEN | data scaling | . |
| XUONG) | data scaling | . |
| X-PLOR | phasing | 3.1 |
