X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.2 293 CRYSTALS WERE GROWN BY SITTING DROP AGAINST 12% AMMONIUM SULPHATE SOLUTION AT THE SAME BUFFER CONDITION IN THE RESERVOIR., pH 7.2, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 41.520 Å b: 68.090 Å c: 51.440 Å α: 90.00° β: 113.56° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.03 Solvent Content: 39.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R 1.11 10.00 85628 1745 82.7 ? 0.1236 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.11 25.00 87.5 0.052 ? 20.6 3.2 ? 90855 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.11 1.15 81.3 ? ? 3.0 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X9B 1.009 NSLS X9B
Software
Software Name Purpose Version
HKL-2000 data collection SUITE
SCALEPACK data scaling .
AMoRE phasing .
SHELXL-97 refinement .
HKL-2000 data reduction .