X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.1 291 0.05 mM mono-potassium dihydrogen phosphate, 20 % (w/v) polyethylene glycol 8000, pH 5.1, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 123.624 Å b: 122.843 Å c: 48.513 Å α: 90.00° β: 100.13° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.61 Solvent Content: 52.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.6 30 21105 1075 96 ? 0.258 42.3
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 30 96 0.099 0.071 14.4 3.54 21813 21105 0 0 55.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.69 91.8 ? 0.314 3.15 3.55 8434
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I711 1.0232 MAX II I711
Software
Software Name Purpose Version
XDS data scaling .
TRUNCATE data reduction .
AMoRE phasing .
CNS refinement 1.0
XDS data reduction .
CCP4 data scaling (TRUNCATE)
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