ISDA

1H6M

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.80	289	CRYSTALS OF THE HEWL COVALENT INTERMEDIATE WERE GROWN BY THE HANGING-DROPLET VAPOUR DIFFUSION METHOD OVER 4 DAYS AT 16 C. THE DROPLET CONTAINED 2.5 UL OF A SOLUTION OF 7.5 MG/ML HEWL(E35Q), 20 MM NAG2FGLCF, 200 MM SODIUM ACETATE (NAOAC) BUFFER PH 5.0 AND 2.5 UL OF RESERVOIR SOLUTION (200MM) NAOAC, CONTAINING 4.0 % NACL (W/V), PH 4.5 WAS SUSPENDED OVER THE RESERVOIR SOLUTION.

Unit Cell:

a: 78.632 Å b: 78.632 Å c: 36.700 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 43 21 2

Crystal Properties:

Matthew's Coefficient: 1.9 Solvent Content: 39.8

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.64	18.00	13781	738	99.3	0.172	0.222	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.640	20.000	99.3	0.05000	?	25.0000	5.200	?	14536	?	?	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.64	1.70	96.3		?	4.600	2.50	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100.0 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	RIGAKU RU200	?	?	?

Software