X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.50 277 THE TOC34 CRYSTALS WERE GROWN AT 4 DEGREES CELSIUS BY HANGING DROP VAPOR DIFFUSION. A 2-MICROLITER SOLUTION (10 MG/ML IN 50 MM TRIS-HCL AT PH 8.0 AND 0.1 M NACL) WAS MIXED WITH A 2-MICROLITER RESERVOIR SOLUTION CONTAINING 22% PEGMME 5K AND 10% GLYCEROL IN 0.1 M HEPES AT PH 6.5.
Unit Cell:
a: 143.160 Å b: 78.673 Å c: 67.279 Å α: 90.00° β: 91.44° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.13 Solvent Content: 42
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.0 22.42 79906 7786 80.5 0.186 0.230 24.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 31.000 99.0 0.05600 ? 8.0000 7.000 ? 50147 ? 2.000 6.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.10 98.8 ? 1.900 2.50
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-18B 0.9796, 0.9794, 0.9680, 0.9802 Photon Factory BL-18B
Software
Software Name Purpose Version
CNS refinement 1.0
DPS data reduction .
MOSFLM data reduction .
SCALEPACK data scaling .
SOLVE phasing .