X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 300 0.1 M Tris, 0.2 M sodium acetate, 30% PEG 5000, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 300K
Unit Cell:
a: 88.717 Å b: 88.717 Å c: 42.423 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4
Crystal Properties:
Matthew's Coefficient: 1.57 Solvent Content: 78.4
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.8 10.0 15124 747 ? 0.218 0.299 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 10.0 97.4 0.034 ? 21.4 3.33 15124 15124 0.0 0.0 25.02
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.88 79.6 ? ? 2.5 2.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9464,0.9793,0.9794,1.0332 APS 19-ID
Software
Software Name Purpose Version
d*TREK data scaling .
d*TREK data reduction .
SOLVE phasing .
CNS refinement .