ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	295	2 microliters of Hmt1 (8mg/ml) in 50 mM Tris, pH 7.0, 50 mM NaCl, 1 mM EDTA, 1 mM DTT + 2 microliters of reservoir:50 mM sodium hepes, pH 7.5, 14% v/v PEG 400, 100 mM CaCl2 + microseeds in 1 microliter of 20 mM sodium citrate, pH 5.6, 15% w/v PEG 4000, 100 mM ammonium acetate, VAPOR DIFFUSION, HANGING DROP, temperature 22K

Unit Cell:

a: 84.100 Å b: 129.430 Å c: 101.430 Å α: 90.00° β: 102.74° γ: 90.00°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.38 Solvent Content: 48.32

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MAD	THROUGHOUT	2.90	28.0	46590	4666	99.1	0.2530000	0.2940000	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.9	28.0	99.1	0.0620000	?	17.4	3.1	91268	90403	0.0	0.0	56.6

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.89	2.99	95.9	?	0.235	5.0	1.8	8739

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		113 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X12C	0.9784,1.0100,0.9500,0.9788	NSLS	X12C

Software