X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 277 31% PEG-MME 2000, 0.200M Ammonium sulfate, 0.100M MES pH 5.6, 3mM Xylitol, 10mM glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 118.067 Å b: 46.964 Å c: 84.607 Å α: 90.00° β: 98.53° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.37 Solvent Content: 48.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 1.3 25 110239 11040 94.0 0.1320000 0.1790000 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.3 25 97.7 0.0360000 0.0360000 34 4.2 110636 110636 0 -3 11
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.3 25.0 93.0 ? ? 6.6 3.9 20604
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 193 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X9B 0.91825 NSLS X9B
Software
Software Name Purpose Version
MLPHARE phasing .
SHELXL-97 refinement .
DENZO data reduction .
SCALEPACK data scaling .