X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 277 15.5% PEG8000, 50mM Tris pH8.0, 5% Ethylene Glycol, 75mM NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 67.309 Å b: 71.836 Å c: 34.625 Å α: 90.00° β: 96.13° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.4 Solvent Content: 46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 1.94 50.0 22730 2120 95.1 0.2230000 0.2500000 28.8
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.94 50.0 97.7 0.0510000 ? 23.5 3.8 23872 23300 0.0 0.0 18.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.94 2.11 91.9 ? ? ? 3.2 911
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.0283, 0.9795, 0.9793, 0.9351 APS 19-ID
Software
Software Name Purpose Version
CNS refinement .
HKL-2000 data reduction .
SCALEPACK data scaling .
CNS phasing .